Teaching Faculties
Dr. Neelam Chaplot
Associate Professor Department of Computer Science & Engineering
- neelam.chaplot@jaipur.manipal.edu
- PHD, BANSATHALI UNIVERSITY, 2018
- M.TECH, BANSATHALI UNIVERSITY, 2010
- B.E, UNIVERSITY OF MUMBAI, 1997 0
- AI
- MAchine Learning
- Deep Learning
- Twice Received Best Resarcher Award
- Runner up in Techie Track - Hands on! Contest Series
- Guided Six student sponsored project under DST Rajasthan
- Nucleus Member Directorate of Corporate Relation & Placement
- Discipline and Grievance Rederessal Committe
- KPI
- Class Coordinator
- Course Coordinator
- Convener of Health Analytics cluster
- IEEE, Oracle Academy
- Chaplot, N., Pandey, D., Kumar, Y., Sisodia, P.S., Pushpendra Singh, Gaurav Kumar Ameta, Yogesh Kumar (2023), A Comprehensive Analysis of Artificial Intelligence Techniques for the Prediction and Prognosis of Genetic Disorders Using Various Gene Disorders in Journal Archives of Computational Methods in Engineering, Volume 30 issue 05, pp 3301-3323
- Pushpendra Singh, Gaurav Kumar Ameta, Yogesh Kumar, Neelam Chaplot (2023), A Review of Deep Transfer Learning Approaches for Class-Wise Prediction of Alzheimer's Disease using MRI Images, in Journal Archives of Computational Methods in Engineering, Volume 30 issue 04, pp 2409-2429
- Abhilasha, Dr. Vaibhav Vyas, Dr. Neelam Chaplot (2022), Disease Identification in Sunflower Leaves by Deep Learning Technology, Gongcheng Kexue Yu Jishu/Advanced Engineering Science, Volume 54 Issue 02, pp 6561-6575
- Palak Baid, Apoorva Gupta, Neelam Chaplot (2017). Sentiment Analysis of Movie Reviews using Machine Learning Techniques in International Journal of Computer Applications, Foundation of Computer Science (FCS), NY, USA, Volume 179 - Number 7, pp. 45-49 v
- Neelam Chaplot, Praveen Dhyani and O.P. Rishi (2015). Astrological Prediction for Profession using classification techniques of artificial intelligence in International Conference on Computing Communication & Automation (ICCCA), organised by Galgotia University Greater Noida pp 233 - 236, Publisher IEEE Xplorer
